Contact
Hoe winkelen bij ons werkt
Bezorging
Winkelgids
Stress and Microstructural Evolution in Metal Oxide Thin Films
Stress and functionality
Engels
140 b
Tot 30 dagen retourrecht
Klanten kochten ook
/
Gebonden (paperback)
27.33
€
/
Digitaal
14.93
€
/
Gebonden (paperback)
27.13
€
/
Gebonden (paperback)
12.80
€
/
Gebonden (paperback)
21.03
€
/
Gebonden (paperback)
11.78
€
/
Gebonden (paperback)
43.09
€
/
Gebonden (paperback)
15.54
€
System on Chip (SoC) and System in Package (SiP) are two electronic technologies that involve integrating multiple functionalities onto a single platform. When the platform is a single wafer, as in SOC, it requires the ability to deposit various materials that enable the different functions on to an underlying substrate that can host the electronic circuitry. Transition metal oxides which have a wide range of properties are ideal candidates for the functional material. These oxides need to be deposited on Si in certain crystallographic orientations. Thus, during growth of the functional oxide, an ambience in which the Si itself will not oxidize needs to be provided. In addition, during thin film growth on either Si or SiOx surface stresses are generated from various sources. Stress and its relaxation are also associated with the formation and evolution of defects. Both, stress and defects need to be managed in order to harness their beneficial effects and prevent detrimental ones.
Informatie over het boek
Engels
Categorieën
Geef dit boek vandaag nog cadeau
Dat gaat heel eenvoudig
1 Voeg het boek toe aan je winkelwagentje en selecteer Als cadeau bezorgen 2 Je krijgt van ons per omgaand een voucher 3 Het boek wordt bezorgd op het adres van de ontvangerDit vind je misschien ook interessant
/
Gebonden (paperback)
31.40
€
/
Gebonden (paperback)
15.34
€
/
Gebonden (paperback)
11.27
€
/
Gebonden (paperback)
213.03
€
